ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,778, issued on Sept. 22, was assigned to GE Precision Healthcare LLC (Waukesha, Wis.). "Guidance for patient in pelvic examination" was in... और पढ़ें
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,779, issued on Sept. 22, was assigned to GE PRECISION HEALTHCARE LLC (Waukesha, Wis.). "System and methods for cardiac cycle selection" wa... और पढ़ें
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,780, issued on Sept. 22, was assigned to Blaize Inc. (El Dorado Hills, Calif.). "Method and systems for predicting medical conditions and ... और पढ़ें
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,781, issued on Sept. 22, was assigned to Memorial Sloan Kettering Cancer Center (New York), Memorial Hospital for Cancer and Allied Disease... और पढ़ें
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,782, issued on Sept. 22, was assigned to Halliburton Energy Services Inc. (Houston). "Rock image analysis using three-dimensional segmenta... और पढ़ें
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,783, issued on Sept. 22, was assigned to Adobe Inc. (San Jose, Calif.). "Generating improved panoptic segmented digital images based on pa... और पढ़ें
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,784, issued on Sept. 22, was assigned to Canon K.K. (Tokyo). "Medical image processing apparatus and medical image processing method" was ... और पढ़ें
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,785, issued on Sept. 22, was assigned to Panasonic Automotive Systems Co. Ltd. (Kanagawa, Japan). "Marker, edge detection device, and edge... और पढ़ें
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,786, issued on Sept. 22, was assigned to Ricoh Co. Ltd. (Tokyo). "Image processing device, image forming apparatus, and edge detection met... और पढ़ें
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,787, issued on Sept. 22, was assigned to FUJI Corp. (Chiryu, Japan). "Component inspection method and component inspection device" was inv... और पढ़ें